High Speed Characterization of Photonic Integrated Circuits

Extensive high speed characterization of photonic integrated circuits (PIC) is essential in accelerating the time in which improvements in the functionality, performance and reliability of PICs are made. Current characterization of PICs requires the use of different measurement equipment working independently to gather data as well as requiring manual input throughout the testing process, reducing accuracy and increasing user error. Integrating the equipment to work as one and completely automating the testing procedures will lead to more accurate, reliable test results and faster generation of multi-dimensional tuning maps (MDTMs). Software written in Visual Basic implemented with the Keithley 4500 Modular Test System (MTS) will be used as a hub to integrate the use of the many source-measure channels with external optical measurement equipment. The MTS is capable of varying the operating point of multiple components simultaneously, making it possible to “turn every knob” in the circuit at once. Together with the integration of external optical testing equipment, will allow for a greater understanding of how integrated optical components function in a single-chip system, such as wavelength converters. MDTMs for lasers as well as extinction characterization of electroabsorption and Mach-Zehnder modulators are two examples of data that are being acquired with this equipment. This software will allow seamless integration of the different electrical and optical measuring equipment and the production of MDTMs at a fraction of the time required today. The high speed characterizations developed will improve the implementation and design of future PICs.